ANALYTICAL CHEMISTRY FOR METROLOGISTS AND ENGINEERS

A Short Course in the Stranaska Analytical Metrology Education Program (SAMEP)

[C-02A10]: A 1-Day Short Course (MSC 2010 Tutorial Workshop Program, Workshop T-02)

WHEN: March 23, 2010

WHERE: Pasadena, California USA

VENUE: Pasadena Convention Center / Hilton Pasadena Hotel

INSTRUCTOR: Jerry D. Messman, Ph.D.

EARLY REGISTRATION FEE: $495.00 (Deadline - February 28, 2010)

REGULAR REGISTRATION FEE: $595.00

NOTE: The short course for this specific venue is available through the MSC 2010 Tutorial Workshop Program as a courtesy of Stranaska Scientific LLC. Registration fees for this short course are not payable to Stranaska Scientific LLC, but rather to Measurement Science Conference - MSC 2010. For registration and conference information, please contact the MSC website: www.msc-conf.com.

SHORT COURSE DESCRIPTION

Analytical chemistry is the interdisciplinary science of chemical analysis with qualitative, quantitative, and/or structural measurement objectives. It plays a major problem-solving role in research, development, quality control and manufacturing support in many industrial sectors including agricultural, clinical, environmental, food and beverage, forensics, petrochemical, and pharmaceuticals.

Chemical analysis involves the designed interaction of atoms, ions, or molecules comprising the sample material (gas, liquid or solid) with a probing medium (e.g., photons, electrons, etc) which is characteristic of the analysis technique. The measurement results facilitate interpretation and informational insight into the nature of the problem at hand upon which informed decisions or actions can be based. Analytical metrology is the cornerstone of most measurement assurance programs in chemical analysis, especially within the framework of quality management systems including ISO/IEC 17025 accreditation.

The purpose of this fast-paced short course is to familiarize the metrologist and engineer with a broad range of topics which are fundamental to analytical chemistry so that they will be able to effectively communicate and interact with analytical chemists or other analytial laboratory staff. Definitions, terminology, concepts, concentration units, basic calculations, parameter figures of merit, method validation criteria, and procedural strategies common to the analytical chemist will be introduced. The generic building blocks of the analytical process will be described, and then applied to a variety of representative chemical analysis problems.

Instruction will include cursory examinations of sampling, sample preparation and pre-treatment, analysis and quantitation, data collection and treatment, and reporting and decision impact of the analytical results. Several of the sub-disciplines of analytical chemistry (e.g., gravimetry, titrimetry, optical spectrometry, mass spectrometry, chromatography, electrochemistry, thermal analysis, etc.) will be discussed. Exemplary scenarios of analytical chemistry in the real world will be described. A basic knowledge of chemistry and physics is recommended, but not required.

WORKSHOP DEVELOPER BIOGRAPHY

Jerry D. Messman holds a Ph.D. degree in analytical chemistry from the University of Maryland. He has been involved in various spectrometric aspects of analytical metrology throughout his entire professional career beginning 30+ years ago with the National Bureau of Standards (NBS). During his tenure at the National Institute of Standards and Technology (NIST) from 1988 to 1992, Jerry was responsible for rejuvenation of the high-accuracy spectrophotometric standards program in the Chemical Sciences and Technology Laboratory. For the past 15 years, he has served as Managing Director and Senior Scientist of Stranaska Scientific LLC, a research and development company specializing in analytical UV/VIS spectrophotometric metrology.

Jerry D. Messman is an elected member of CITAC, an acronym for the Cooperation on International Traceability in Analytical Chemistry. In addition to this short course, Jerry has developed other courses, seminars and workshops including "Analytical UV/VIS Absorption Spectrophotometer Metrology," "Metrology in the Analytical Laboratory," "Measurement Uncertainty in Analytical Chemistry," and "Introduction of Metrology to the Analytical Chemistry Curriculum."

For additional short course information, please contact Jerry Messman: education@stranaska.com.

REMINDER: Registration for the short course for this specific venue is administered solely by Measurement Science Conference (MSC 2010). Please do not register here! For registration and conference information, please contact the MSC website: www.msc-conf.com.