SAMEP [C-01A10]: UV/VIS ABSORPTION SPECTROPHOTOMETER METROLOGY

WHEN: To Be Announced (TBA)

WHERE: To Be Announced (TBA)

REGISTRATION FEE: $595.00 (Estimate -Subject To Change)

Stranaska Scientific invites you to attend a short course on UV/VIS absorption spectrophotometer standardization. It is a version of the company's flagship short course developed and offered exclusively through the Stranaska Analytical Metrology Education Program (SAMEP). The central theme of the course is metrological traceability and its measurement assurance role in analytical UV/VIS spectrophotometer qualification within the framework of technical quality management systems including ISO/IEC 17025.

SHORT COURSE DESCRIPTION

International standards organizations recognize the important role of metrology in facilitating comparability of analytical measurement results over time and space. Analytical instrument qualification (AIQ) and laboratory quality control (QC) are crucial synergistic steps in the overall quality scheme for chemical analysis and physical testing. Traceability and uncertainty (interval) estimation are two key metrological properties of analytical measurements which allow for their meaningful comparisons and acceptance. Within a laboratory’s measurement assurance program, metrological traceability and estimation of measurement uncertainty are critical requirements of ISO 17025 accreditation and many technical quality management systems.

Measurement standards, or transfer artifacts, are central to calibration and quality control in analytical science. It is this common mechanism in which metrological traceability is usually established at appropriate stages throughout the analytical measurement system. Traceability of transfer artifacts for UV/VIS absorption spectrophotometers is not a new concept, yet many commercial suppliers of these standards continue to struggle on how to substantiate the interpretation of their claims of traceability. When using measurement standards with suspect traceability claims, the unbroken chain of traceability of field spectrophotometric calibration results may be challenged by knowledgeable regulators, quality inspectors, and accreditation auditors.

This course provides a rigorous science-based perspective on metrological traceability of transfer artifacts for UV/VIS absorption spectrophotometers and microplate photometers. You will learn firsthand how to examine the traceability claims of your commercial cuvette-based filters and OEM verification and validation microplates. While the focus is on analytical spectrophotometers, this course provides a paradigm that transcends to other analytical instruments in the laboratory.

The learning objective of this short course is to gain a full understanding of the metrological principles and concepts relevant to the qualification and quality control of analytical UV/VIS absorption spectrophotometers (cuvette-based and microplate formats). Participants will become comfortable and knowledgeable in the process of selecting and implementing the appropriate measurement standards, in both cuvette and microplate formats, that establish metrological traceability (to the NIST reference spectrophotometer) of laboratory spectrophotometer qualification and quality control data. You will acquire unique insight into the following, and more:

• Certified reference materials from NIST and commercial analytical metrology companies

• Selection process for ensuring the use of an appropriate reference(s)

• Traceability pathways and timelines

• Measurement uncertainty and budgets

• Transparency and interpretation of commercial CRM certificates

• Importance of "as-received" data and out-of-tolerance assessment in recertifications

• Recertification intervals for reference material standards

• Standardization of commercial OEM absorbance microplates and proof of traceability of certified values

• Demonstrating control of the reference spectrophotometer during calibration measurements

• Advances in measurement standards for wavelength, resolution, stray light, and photometric/linearity testing

Attend this course and you will hear the latest developments and advancements in UV/VIS standards for analytical spectrophotometer qualification and laboratory quality control. Learn the secrets to recognizing whether your current cuvette-based and microplate reference materials meet the modern criteria for establishing metrological traceability of your laboratory UV/VIS spectrophotometric analyses. Learn how to self-critique your existing calibration certificates for traceability criteria and defensibility! By the end of the course, you will be able to upgrade your organization’s measurement assurance program with the latest information and strategies for establishing measurement traceability in UV/VIS absorption spectrophotometer standardization.

INSTRUCTOR BIOSKETCH
Jerry D. Messman holds a Ph.D. degree in analytical chemistry from the University of Maryland. He has been involved in various analytical spectrometric aspects of metrology throughout his entire professional career beginning 30+ years ago with the National Bureau of Standards (NBS). During his tenure at the National Institute of Standards and Technology (NIST) from 1988 to 1992, Jerry accepted the challenge of rejuvenating the high-accuracy spectrophotometric standards program in the Chemical Sciences and Technology Laboratory. During that time, he directed all NIST technical activities involving the production, certification, and recertification of UV/VIS spectrophotometric Standard Reference Material (SRM) artifacts including SRM 2034, SRM 930, SRM 931, SRM 1930, and SRM 2031. For the past 15 years, Jerry has served as Managing Director and Senior Scientist of Stranaska Scientific LLC, an analytical research and development company specializing in UV/VIS absorption spectrophotometric metrology. Jerry is an elected member of CITAC, an acronym for the Cooperation on International Traceability in Analytical Chemistry.

REGISTRATION
Information will be updated once course dates and venue have been established. Registrations can be processed on-line. Also, you may obtain a registration form by contacting us at 970-282-3840 or education@stranaska.com.

STRANASKA VISION
Underpinned by its proud heritage and cultural linkage to NIST, and leveraged through the scientific rigor of its PhD-credentialed research and development programs, Stranaska Scientific strives to promote and advance the state-of-the-art of spectrophotometric metrology and its analytical applications.